Call for Participation
Workshop on Silicon Errors in Logic – System Effects
Stanford University — March 26-27, 2013
Paper Submission Deadline: January 7, 2013
The growing complexity and shrinking geometries of modern device technologies are making high-density, low-voltage devices increasingly susceptible to the influences of electrical noise, process variation, transistor aging, and the effects of natural radiation. The system-level impact of these errors can be far-reaching. Growing concern about intermittent errors, unstable storage cells, and the effects of aging are influencing system design. This workshop provides a forum for discussing current research and practice in system-level error management. Participants from industry and academia explore both current technologies and future research directions (including nanotechnology). SELSE is soliciting papers that address the system-level effects of errors from a variety of perspectives: architectural, logical, circuit-level, and semiconductor processes. Case studies are also solicited.
Key areas of interest are (but not limited to):
- Technology trends and the impact on error rates
- New error mitigation techniques
- Characterizing the overhead and design complexity of error mitigation techniques
- Case studies describing the engineering tradeoffs necessary to decide what mitigation technique to apply
- Experimental data
- System-level models: derating factors and validation of error models
- Error handling protocols (higher-level protocols for robust system design)
Authors are requested to submit extended abstracts for review before December 14, 2012 January 7, 2013. Authors intending to submit are encouraged to register their paper (Title, Author's names) by December 14th, 2012. Extended abstracts will be considered for both oral and poster presentation. All accepted submissions are included in the workshop proceedings. Authors will be notified of paper outcome by February 2, 2013 February 5, 2013. Camera-ready papers are due on March 4, 2013.
Additional information and guidelines for submission are available here. Submissions should be PDF or Microsoft Word files in IEEE format that do not exceed four printed pages. Camera-ready papers can be up to six pages in length in IEEE format. Papers are not made available through IEEE and authors retain the copyright of their work. Authors may optionally choose to make their final papers available online through the SELSE webpage.
- Extended abstract submission: December 14, 2012 January 7, 2013
- Authors notification: February 2, 2013 February 5, 2013
- Camera-ready submission: March 4, 2013